Syllabus
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Course Code: EP-1002 Course Name: Modern Characterization Techniques |
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| MODULE NO / UNIT | COURSE SYLLABUS CONTENTS OF MODULE | NOTES |
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| 1 | Electron Microscopy: introduction, Electron optics; Principle, instrumentation, methodology and applications of Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM) and Atomic Force Microscope (AFM). Rutherford backscattering spectrometry (RBS): Principle, kinematics, instrumentation, depth profile and applications. Elastic recoil detection analysis (ERDA): Principle, instrumentation, methodology and applications. |
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| 2 | Auger Electron spectroscopy (AES): Principle, instrumentation, methodology and applications of AES in composition analysis and depth profiling; X-ray photoelectron spectroscopy (XPS): principle, instrumentation, methodology and applications Secondary ion mass spectroscopy (SIMS): Principle, instrumentation, working and application. Glancing angle X-ray diffraction: Basic concept, Instrumentation and structural analysis applications. |
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| 3 | NMR: The principle of NMR, NMR spectrometer, Relaxation mechanisms, chemical shift; spin-spin coupling, applications of NMR spectroscopy. ESR: ESR spectrometer, substances which can be studied by ESR, Resonance condition. Description of ESR by Precession, Relaxation mechanisms, Features of ESR spectra (a) Fine structure (b) hyperfine structure and applications of ESR. |
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| 4 | UV-Visible Spectroscopy: Introduction, instrumentation and applications.
Thermal analysis tools: TGA, DTA /DSC- Basic principle, instrumentation and applications. FTIR spectroscopy: Basic concept, instrumentation, different mode of operation and applications. Raman spectroscopy: introduction: Basic concept, instrumentation and applications. |
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