Syllabus
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Course Code: EP-705 Course Name: Engineering Physics Laboratory-I (General) |
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| MODULE NO / UNIT | COURSE SYLLABUS CONTENTS OF MODULE | NOTES |
|---|---|---|
| 1 | 1. Determination of Half Life of 'In'. | |
| 2 | 2. Determination of Ionization Potential of Lithium. | |
| 3 | 3. Measurement of resistivity of a semiconductor by four probe method at different temperatures and Determination of band gap. | |
| 4 | 4. Measurement of Wavelength of He-Ne Laser light using ruler. | |
| 5 | 5. Measurement of thickness of thin wire with laser | |
| 6 | 6. e/m of electron by Helical method. | |
| 7 | 7. To study uncertainty principle using Laser. | |
| 8 | 8. To study Faraday Effect using He-Ne Laser. | |
| 9 | 9. To determine Planck’s Constant (h) by measuring the voltage drop across light-emitting diodes (LEDs) of different colours. | |
| 10 | 10. Measurement of thickness of thin films using Michelson interferometer. | |
| 11 | 11. Measurement of coherence length using Michelson interferometer. | |
| 12 | 12. To find Flashing and Quenching voltage of Neon gas and determine the capacitance of a unknown capacitor. | |
| 13 | 13. To determine the capacitance of a parallel plate Capacitor using Capacitance and permittivity kit | |
| 14 | 14. Determination of Lande's ‘g’ factor of DPPH using Electron - Spin resonance (E.S.R.) Spectrometer. | |
| 15 | 15. X-ray diffraction by Telexometer. | |
| 16 | 16. Measurement of Hall coefficient of given semiconductor: Identification of type of semiconductor and estimation of charge carrier concentration. | |
| 17 | 17. Energy band gap of Ge Crystal. | |
| 18 | 18. Magnetic susceptibility by Gauy's method. | |
| 19 | 19. To determine the plateau characteristics of G.M. Counter and to find out the absorption coefficient foil absorber using B-Delay source. | |
| 20 | 20. Determination of range of Beta-rays from Ra and Cs. | |
