Syllabus
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Course Code: PHY 404C Course Name: Material Science-II |
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| MODULE NO / UNIT | COURSE SYLLABUS CONTENTS OF MODULE | NOTES |
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| 1 | Material Testing (12 hrs.) The Tension Test: engineering stress-strain curve, true stress-strain curve, instability in tension, Considere’s construction, ductility measurement, effect of strain rate on flow properties, strain rate sensitivity; notch tensile test; The Hardness Test: Brinell hardness, Meyer hardness, Vicker's hardness number and test, Rockwell hardness test, Knoop hardness number and test; The Impact Test: brittle fracture problem, notched bar impact tests-Carpy and Izod Impact tests; The Fatigue Test: fatigue failures, stress cycles, the S-N curve, fatigue limit; The Creep Test: creep curve, primary, secondary and tertiary creep, effect of temperature and stress on the creep curve. |
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| 2 | Magnetic Materials (12 hrs.) Magnetic Processes: Larmor frequency; Diamagnetism, magnetic susceptibility, Langevin's diamagnetism equation; Paramagnetism, Curie constant, density of states curves for a metal; Ferromagnetism, Curie temperature, Curie-Weiss law, exchange interactions, domain structure; Antiferromagnetism and magnetic susceptibility of an antiferromagnetic material; Ferrimagnetism and Ferrites; Paramagnetic, ferromagnetic and cyclotron-resonance. |
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| 3 | Dielectric, Optical and Ferroelectric Materials (12 hrs.) Introduction, Energy bands, dielectric constant, complex permittivity, dielectric loss factor, polarization, mechanism of polarization, classification of dielectrics-frequency dependence of dielectric constant; Optical Phenomena in Insulators Colour of crystals - Excitons - weakly bound and tightly bound excitons. Colour centers – F-centers and other electronic centers in alkali halides. Ferroelectrics: General characteristics - piezoelectric, pyroelectric and ferroelectric materials . Classification of ferroelectrics and representative materials. Ferroelectric domains. polarization catastrophe, Landau theory of first and second-order phase transitions, Antiferroelectric materials |
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| 4 | Solid Surfaces and Analysis (12 hrs.) Surface and its importance, selvedge depths of surface; Methods of Surface Analysis: Auger Electron spectroscopy (AES)- basic principle, methodology, composition analysis and depth profiling; X-ray photoelectron spectroscopy (XPS) or ESCA: principle, methodology and quantitative analysis; Glancing angle X-ray Diffraction (GXRD), basic concept, methodology and structural analysis; Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM): Principle, methodology and Applications in surface analysis; Atomic Force Microscopy (AFM): Basic principle, Methodology, applications in structural analysis. |
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