Syllabus
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Course Code: PHY 304C Course Name: Material Science-I |
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| MODULE NO / UNIT | COURSE SYLLABUS CONTENTS OF MODULE | NOTES |
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| 1 | Imperfections in Solids (12 hrs.) Point Defects: vacancy, substitutional, interstitial, Frenkel and Schottky defects, equilibrium concentration of Frenkel and Schottky defects; Line Defects: slip planes and slip directions, edge and screw dislocations, Burger’s vector, cross-slip, glide and climb, jogs, dislocation energy, super & partial dislocations, dislocation multiplication, Frank ¬Read sources; Planar Defects: grain boundaries and twin interfaces; Dislocation Theory – experimental observation of dislocation, dislocations in FCC, HCP and BCC lattice. |
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| 2 | Mechanical Properties (12 hrs.) Stress Strain Curve; Elastic Deformation: atomic mechanism of elastic deformation and anisotropy of Young's modulus, elastic deformation of an isotropic material; Anelastic and Viscous deformation; Plastic Deformation: Schmid’s law, critically resolved shear stress; Strengthening Mechanisms: work hardening, recovery, recrystallization, strengthening from grain boundaries, low angle grain boundaries. yield point. strain aging, solid solution strengthening, two phase aggregates, strengthening from fine particles; Fracture: ideal fracture stress, brittle fracture-Griffith's theory, ductile fracture. |
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| 3 | Microstructure (12 hrs.) Solid Solutions and Intermediate Phases: phase rule, unitary & binary phase diagrams, Lever rule, Hume-Rothery rule; Free Energy and Equilibrium Phase Diagrams: complete solid miscibility, partial solid miscibility-eutectic, peritectic and eutectoid reactions, eutectaid mixture; Nucleation, Growth and Overall Transformation Kinetics; Martenstic Transformation; The Iron-Carbon System: various phases, phase diagram, phase transformations, microstructure and property changes in iron-carbon system; Ceramics: glass transition temperature, glassformers, commercial ceramics, mechanical properties, high temperature properties. |
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| 4 | Materials Processing and Characterization (12 hrs.) Ion Implantation: introduction, ion implantation process, depth profile, radiation damage and annealing effects of trace-impurities, implantation induced alloying and structural phase transformation; Rutherford Backscattering Spectrometry (RBS): principle, kinematics of elastic collision, shape of the backscattering spectrum, depth profiles and concentration analysis, applications; Elastic Recoil Detection Analysis (ERDA): basic principle, kinematics, concentration analysis, depth profiling, depth resolution, applications; Secondary Ion Mass Spectroscopy (SIMS): basic principle, working, yield of secondary ions and applications. |
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